Cart (Loading....) | Create Account
Close category search window
 

Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chandra, A. ; Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA ; Chakrabarty, K.

Test data compression and test resource partitioning (TRP) are necessary to reduce the volume of test data for system-on-a-chip designs. We present a new class of variable-to-variable-length compression codes that are designed using distributions of the runs of 0s in typical test sequences. We refer to these as frequency-directed run-length (FDR) codes. We present experimental results for ISCAS 89 benchmark circuits and two IBM production circuits to show that FDR codes are extremely effective for test data compression and TRP. We derive upper and lower bounds on the compression expected for some generic parameters of the test sequences. These bounds are especially tight when the number of runs is small, thereby showing that FDR codes are robust, i.e., they are insensitive to variations in the input data stream. In order to highlight the inherent superiority of FDR codes, we present a probabilistic analysis of data compression for a memoryless data source. Finally, we derive entropy bounds for the benchmark test sets and show that the compression obtained using FDR codes is close to the entropy bounds.

Published in:

Computers, IEEE Transactions on  (Volume:52 ,  Issue: 8 )

Date of Publication:

Aug. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.