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Experimental characterization of coupling effects between two on-chip neighboring square inductors

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4 Author(s)
W. Y. Yin ; Temasek Labs., Nat. Univ. of Singapore, Singapore ; S. J. Pan ; L. W. Li ; Y. B. Gan

Comprehensive experimental results on the coupling effects between two on-chip symmetric and asymmetric neighboring inductors on GaAs substrates are presented. These pairs of inductors are fabricated with the same track width, turn number, and spacing. Based on the S parameters measured using the de-embedding technique, we show the effects of edge distance between these two neighboring inductors on the return and transfer losses, and on self-resonance frequency. Certain ways to reduce the transfer loss are explored.

Published in:

IEEE Transactions on Electromagnetic Compatibility  (Volume:45 ,  Issue: 3 )