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Frequency limitation in the calibration of microwave test fixtures

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5 Author(s)
Ning Hua Zhu ; State Key Lab. on Integrated Optoelectronics, Chinese Acad. of Sci., Beijing, China ; Chen Qian ; You Lin Wang ; E. Y. B. Pun
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The problem of frequency limitation arising from the calibration of asymmetric and symmetric test fixtures has been investigated. For asymmetric test fixtures, a new algorithm based on the thru-short-match (TSM) method is outlined. It is found that the conventional TSM method does not have any inherent frequency limitation, but using the same procedure with an unknown match may lead to the said problem. This limitation can be avoided by using a different algorithm. The various calibration methods for symmetric test fixtures using known standards are also discussed and the origin of the frequency limitation is identified. Several ways in avoiding the problem are proposed. There is good agreement between the theories and experimental data.

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:51 ,  Issue: 9 )