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Using satisfiability in application-dependent testing of FPGA interconnects

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1 Author(s)
M. B. Tahoori ; Center for Reliable Comput., Stanford Univ., CA, USA

In this paper, a new technique for testing the interconnects of an arbitrary design mapped into an FPGA is presented. In this technique, only the configuration of logic blocks used in the design is changed. The test vector and configuration generation problem is systematically converted to a satisfiability (SAT) problem, and state of the art SAT-solvers are exploited for test configuration generation. Experimental results on various benchmark circuits show that only two test configurations are required to test for all bridging faults, achieving 100% fault coverage, with respect to the fault list.

Published in:

Design Automation Conference, 2003. Proceedings

Date of Conference:

2-6 June 2003