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Efficient model order reduction including skin effect

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3 Author(s)
Shizhong Mei ; Electr. & Comput. Eng., Northwestern Univ., Evanston, IL, USA ; Amin, C. ; Ismail, Y.I.

Skin effect makes interconnect resistance and inductance frequency dependent. This paper addresses the problem of efficiently estimating the signal characteristics of any RLC network when skin effect is significant, which complicates interconnect simulation namely, the square root moments. The time to calculate the square root moments is similar to the time to calculate the traditional moments, and the new moments preserve the recursive properties of the traditional moments. Hence, the method introduced here can handle the more complex problem of interconnect simulation with skin effect at almost no overhead compared to constant element interconnect simulation. Using the square root moments, higher order approximations can be reached as compared to traditional moments. Also, the PVL method is modified to implicitly match the square root moments. The simulation results reveal the high accuracy of the proposed methods as well as the apparent variation in the signal characteristics caused by skin effect.

Published in:

Design Automation Conference, 2003. Proceedings

Date of Conference:

2-6 June 2003