Cart (Loading....) | Create Account
Close category search window
 

Knowledge maps as lexical signatures of journals papers and patent documents

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Al-Thubaity, A.M. ; Dept. of Comput., Surrey Univ., Guildford, UK ; Ahmad, K.

The transfer of knowledge from research laboratories and academic seminars to the industrial/commercial sector is a strategically important issue. Text analysis of journal papers and patent documents, written by one scientist and his team in the specialist area of semiconductor physics, has been performed in order to visualize the cross-over of research knowledge onto patented artifacts. The results shows the time lag in the cross-over and will serve to bring knowledge visualization and information extraction techniques in the rather quantitative arena of strategic policy making in science and its application to technology.

Published in:

Information Visualization, 2003. IV 2003. Proceedings. Seventh International Conference on

Date of Conference:

16-18 July 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.