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Test pattern generator and logic simulator based on object oriented PSPICE net list

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2 Author(s)
bin A'ain, A.K. ; Dept. of Electron., Univ. Teknol. Malaysia, Johor, Malaysia ; Ooi Chia Yee

The adoption of object-oriented programming (OOP) paradigm to design and implement the test pattern generator became popular a few years ago because it provides a feature of data abstraction. Many test pattern generation methods use graph to implement the search operation and graph is a type of Abstract Data Type (ADT). PODEM is the base algorithm in the test pattern generator in this paper. The reason for this is its simplicity. Since PODEM is a structural method, it is easy to be coded in OOP. Moreover, by using OOP other technique can be added into it and the efficiency of the mixed technique can be learnt easily. In this paper, PODEM has been modified to improve the performance. Controllability factors are considered in back-trace procedure. Observability factors are considered in D-propagation procedure. Number of backtracking has been reduced in the object-oriented test pattern generator.

Published in:

Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on

Date of Conference:

19-21 Dec. 2002