By Topic

A tool towards integration of IC process, device, and circuit simulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
G. Chin ; Center for Integrated Syst., Stanford Univ., CA, USA ; R. W. Dutton

An interactive simulation system, comprised of an integrated set of tools, suitable for accurate characterization of arbitrary submicrometer devices is presented. The system, which is an extension of the University of California, Berkeley, tool SIMPL-IPX, uses a transparent link with 2D device simulation and provides an application-specific interface to 3D. While the system can be used to generate typical device characteristics (I-V curves and delay analysis) useful for sensitivity analysis and analytic model development, a greater benefit of the system is its ability to analyze parasitic devices that may lead to reliability problems. These parasitic devices are extremely difficult to characterize and tend to be overlooked. The system is used to investigate the influence of these parasitics by analyzing the effect of layout on the latch-up characteristics of a standard logic cell

Published in:

IEEE Journal of Solid-State Circuits  (Volume:27 ,  Issue: 3 )