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Theorems for identifying undetectable faults in partial-scan circuits

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2 Author(s)
Pomeranz, I. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Reddy, S.M.

We provide a definition of undetectable faults in partial-scan circuits under a test application scheme where a test consists of primary input vectors applied at-speed between scan operations. We also provide sufficient conditions for a fault to be undetectable under this test application scheme. We present experimental results on finite-state machine benchmarks to demonstrate the effectiveness of these conditions in identifying undetectable faults.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:22 ,  Issue: 8 )