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Measurement of Q degradation due to polarisation mode dispersion using multiple importance sampling

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8 Author(s)
L. -S. Yan ; Dept. of Electr. Eng.-Syst., Univ. of Southern California, Los Angeles, CA, USA ; M. C. Hauer ; P. Ebrahimi ; Y. Wang
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Multiple importance-sampling (IS) is used to measure the Q degradation due to the polarisation mode dispersion generated by three programmable DGD elements with uniform polarisation coupling between sections. The measured Q-penalty probability distribution extends to <10-17 with only 1800 experimental samples.

Published in:

Electronics Letters  (Volume:39 ,  Issue: 13 )