IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Electronics Letters ...> Volume:39 Issue:13 Help

Antenna far-fields from planar acquisition using micro-genetic algorithms

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Perez, J.R. ; Dept. of Commun. Eng., Univ. de Cantabria, Santander, Spain ; Basterrechea, J.

A method for modelling the radiation of an antenna under test from planar near-field data using equivalent magnetic currents (EMC) is presented. Micro-genetic algorithms are used to optimise each component of the EMC. Numerical results of near-field to far-field transformation are reported and discussed.

Published in:
Electronics Letters  (Volume:39 ,  Issue: 13 )

Date of Publication: 26 June 2003

Page(s):
948 - 949
ISSN :
0013-5194
INSPEC Accession Number:
7673341
Digital Object Identifier :
10.1049/el:20030630
Product Type:
Journals & Magazines
Date of Current Version :
28 July 2003
Issue Date :
26 June 2003
Sponsored by :
Institution of Engineering and Technology

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.