Cart (Loading....) | Create Account
Close category search window
 

On-line testable decimation filter design for AMS systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Naal, M.A. ; TIMA Lab., Grenoble, France ; Simeu, E. ; Mir, S.

This paper presents an implementation of on-line testing techniques for the case of a decimation filter. The decimation filter is used in a ΣΔ analogue-to-digital converter that is in turn used in a built-in-self-test (BIST) circuitry for mixed-signal core testing. Thus, the filter itself must be self-testable. Three different one-line self-test techniques are studied and compared for a 0.18 μm CMOS technology. The first one uses a non-concurrent structural test technique and the others are both based on semi-concurrent test methodologies. In all cases, the on-line test circuitry is automatically synthesized and exploits the idle time of the functional units to apply either a structural or a functional test.

Published in:

On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE

Date of Conference:

7-9 July 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.