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A sense amplifier based circuit for concurrent detection of soft and timing errors in CMOS ICs

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4 Author(s)
Tsiatouhas, Y. ; Comput. Sci. Dept., Ioannina Univ., Greece ; Matakias, S. ; Arapoyanni, A. ; Haniotakis, T.

We propose a new concurrent soft and timing error detection circuit that exploits the time redundancy approach to achieve tolerance with respect to transient and delay faults. The idea is based on current mode sense amplifier topologies to provide fast error detection times.

Published in:

On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE

Date of Conference:

7-9 July 2003