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Compacting test responses for deeply embedded SoC cores

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2 Author(s)
Sinanoglu, O. ; Univ. of California, USA ; Orailoglu, A.

Test bandwidth allocation issues greatly limit the parallel testing of SoC cores. Here, the authors propose a response compaction methodology for reducing the required output core bandwidth, enabling increased parallelism among core tests and hence reducing the overall SoC test time.

Published in:

Design & Test of Computers, IEEE  (Volume:20 ,  Issue: 4 )