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Notice of Violation of IEEE Publication Principles
Performance enhancements of ad hoc networks with localized route repair

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4 Author(s)
Duggirala, R. ; Cisco Syst., San Jose, CA, USA ; Gupta, R. ; Qing-An Zeng ; Agrawal, D.P.

Notice of Violation of IEEE Publication Principles

After careful and considered review of the content and authorship of this paper by a duly constituted committee, this paper has been found to be in violation of IEEE's Publication Principles.

This paper contains significant portion of original text from the paper cited below. The original text was copied without attribution (including appropriate references to the original author(s) and/or paper title) and without permission.

Ionut D. Aron and Sandeep K.S. Gupta, "Analytical Comparison of local and End-toEnd Error Recovery in Reactive Routing Protocols for Mobile Ad Hoc Networks," Proceedings of the 3rd ACM Int. Workshop on Modeling, Analysis and Simulation of Wireless and Mobile Systems (MSWIM 2000) pp. 69-76, August 2000.

In ad hoc networks, information transfer is achieved in multihop mode using peer-to-peer routing. A route consisting of multihops breaks primarily because of the failure of single or adjacent links, caused by relative movement of one or more nodes. To address this inherent characteristic of ad hoc networks, we propose and analyze an on-the-fly strategy that locally repairs the broken route, thereby minimizing the routing overhead. The main motivation behind our Localized Route Repair (LRR) work is to decrease the reaction time of routing protocols, which totally avoids retransmissions. A detailed simulation with MAC layer and physical layer model is used to understand the impact of this mechanism on the performance of routing protocol. An analytical model for the LRR technique is also presented and the results observed to match well with the simulation results. Our technique clearly achieves substantial improvement in terms of communication delay, routing overhead, and, hence, provides enhanced reliability.

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Computers, IEEE Transactions on  (Volume:52 ,  Issue: 7 )