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This study describes "static scan" and "dynamic scan" methods to measure the integral magnetic field using a long-loop-flip coil, and to characterize the elliptically polarizing undulator and other insertion device magnets in a synchrotron light source. The basic design concept is to build a reliable, precise, and fast automatic measurement system for integral magnetic field measurement on the two transverse axes. An advanced analysis method is developed to compensate for the electronic signal drift of the integrator. A multifunction LabView application program was developed on a personal computer main control unit, with Microsoft Windows 3.1-98. Several personal computer slot interface cards communicate with and control the various devices. The system hardware and the theory underlying measurement and analysis are described below.