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Generating test inputs for embedded control systems

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3 Author(s)
Qianchuan Zhao ; Dept. of Autom., Tsinghua Univ., Beijing, China ; Krogh, B.H. ; Hubbard, P.

Embedded control systems are growing rapidly, and there is a need for short design cycles. As a result, there is increasing interest in effective methods for automatic test generation. The authors present a new method for leveraging existing simulation models, involving genetic algorithms, for embedded control system designs to generate test inputs automatically, thereby eliminating the time-consuming task of creating them manually.

Published in:

Control Systems, IEEE  (Volume:23 ,  Issue: 4 )