Solution processing of lanthanum zirconate films as single buffer layers for high I_c YBCO coated conductors

Sol-gel processing of lanthanum zirconate (La₂Zr₂O₇ - referred to as LZO) buffer layers on biaxially textured nickel and Ni-3 at.% W alloy substrates using spin coating and a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. This coating and annealing process was repeated to get the desired buffer layer thickness. On these all-solution single buffer layer substrates, YBCO films were grown using pulsed laser deposition process. Critical current density about 2 MA/cm² at 77 K and self-field has been obtained on these samples. Continuous processing of these substrates and processing of high I_c YBCO films on them will be discussed.