Cart (Loading....) | Create Account
Close category search window

Magnesium diboride superconducting quantum interference devices fabricated by focused ion beam

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Burnell, G. ; Dept. of Mater. Sci., Univ. of Cambridge, UK ; Tarte, E.J. ; Yates, K.A. ; Kang, Dae-Joon
more authors

We have recently developed a technique for fabricating Superconductor-Normal-Superconductor (SNS) junctions in MgB2 thin films using a focused ion beam (FIB). These junctions show a strong modulation of the critical current by applied magnetic field and microwaves. We have made Superconducting Quantum Interference Devices (SQUIDs) with directly coupled pick-up loops using this technique which show large voltage modulations (∼200 μV at 6 K) and a white noise level of 15 μΦ0Hz-12/ at 5 kHz. In this work we present the latest results from our devices. We are studying the nature of the barrier created by our fabrication process and also report a preliminary Raman scattering and transport measurement study of resistors made with this technique.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:13 ,  Issue: 2 )

Date of Publication:

June 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.