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Bit error rate determination of RSFQ logic cells by means of noise analysis of basic network components

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3 Author(s)
Ortlepp, T. ; Dept. of Fundamentals & Theor. of Electr. Eng., Univ. of Technol. Ilmenau, Germany ; Toepfer, H. ; Uhlmann, F.H.

The influence of thermal noise gives a major restriction in the development of Rapid Single Flux Quantum (RSFQ) logic circuits with high-Tc superconductors. In the past, we have demonstrated a general way for determining the digital bit error rate and for predicting operation ranges with good noise immunity. The method is based on a single Fokker-Planck equation which includes the full system dynamics. However, the complexity of this equation increases dramatically with the number of Josephson junctions. Our new approach describes a method to divide an RSFQ logic cell into several basic primitives. They can be characterized quickly in terms of switching probability for a lot of different parameters. From these analyses, look-up tables are built-up. We describe how to combine these data in order to achieve the bit-error rate for the whole cell. While saving more than 90% of computation time, the comparison with our previous results for full system analyses shows less than 4% difference. This approach provides for a powerful tool to include the influence of thermal noise into the optimization process of RSFQ logic circuits as well.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:13 ,  Issue: 2 )

Date of Publication:

June 2003

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