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A development of CAD of microwave integrated circuits based on high-Tc superconducting (HTS) films is of high importance. Design of planar HTS microwave devices (filters, multiplexers etc.) is based on a careful simulation of the device characteristics and requires a correct model description of the HTS material. A method of extracting model parameters of HTS film from the experimental characteristics of microwave resonators and filters is considered. It is based on a correct phenomenological model of the HTS film surface impedance and accurate simulation of the microwave resonator (filter). The calculation of the model parameters was realized by Monte Carlo method based on properties of the quasirandom (Halton's) sequences. The set of extracted model parameters is used in the CAD tool for HTS microwave circuits design providing a good agreement between simulated and measured data. A procedure of extracting model parameters of a ferroelectric film from the experimental characteristics is also proposed.