Cart (Loading....) | Create Account
Close category search window

Pattern characteristics of linear arrays using the constrained least squares distribution

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Melde, K.L. ; Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ, USA ; Taylor, M.L.

The constrained least squares (CLS) distribution is a method for obtaining distribution functions that yield low sidelobe patterns with specified constraints on the aperture efficiency, and are especially useful for the transmit patterns of active array antennas. The widely used Taylor distribution optimizes only pattern performance while the CLS distribution optimizes pattern performance while taking into account the constraints on both the peak element amplitude and the total effective radiated voltage (ERV) of the aperture distribution. The paper compares the pattern characteristics of linear arrays with CLS and Taylor distributions. The results help to establish guidelines on when a CLS distribution would be preferable over a Taylor distribution when a specified aperture efficiency is important.

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:51 ,  Issue: 4 )

Date of Publication:

April 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.