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Voltage and lamp flicker issues: should the IEEE adopt the IEC approach?

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6 Author(s)
Halpin, S.M. ; Dept. of Electr. & Comput. Eng., Auburn Univ., Montgomery, AL, USA ; Bergeron, R. ; Blooming, T.M. ; Burch, R.F.
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This paper is intended to provide an overview of the IEC flicker measurement and assessment procedures. The IEC procedures are correlated with existing IEEE flicker standards to show the benefits of the IEC methodology. Application issues, such as customer impact assessment, are also discussed. Three case studies, two field tests, and one EMTP analysis are provided to show the correlation of IEC flickermeter output values with documented customer complaints. The case studies also provide areas where modifications to the IEC flicker standards may be necessary when developing a new IEEE flicker standard.

Published in:

Power Delivery, IEEE Transactions on  (Volume:18 ,  Issue: 3 )

Date of Publication:

July 2003

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