By Topic

Characterization and calibration of a CCD detector for light engineering

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Fiorentin, P. ; Dipt. di Ingegneria Elettrica, Universita degli Studi di Padova, Italy ; Iacomussi, P. ; Martignon, A. ; Rossi, G.

This paper describes the methodology followed for characterizing a commercial CCD camera as a luminance meter for measurements in road light plant. Actually several commercial CCD cameras have been proposed on the market for this type of application and they are sold with full working software including a factory calibration in luminance units (cd/m2). In fact the availability of a high number of closely spaced small detectors (pixels) on a single chip permits analyses almost impossible or very time consuming if carried out with traditional instrument. These devices are sold at prices lower than scientific grade CCD cameras that usually are not commercialized with a V(λ) filter and therefore they could not have a calibration in luminance units. The main counterparts are in the difficulties to define accuracy of measurement, in the low resolution of the A/D converter and in the characteristics of CCD sensor itself. To obtain the best possible results with this type of luminance meters it is necessary to reach a complete metrological characterization and to quantify all the possible effects that could degrade their performances in real measurement situations. In this way the measurement uncertainties might be evaluated correctly and the results could be corrected, if necessary, with ad hoc algorithms.

Published in:

Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE  (Volume:2 )

Date of Conference:

20-22 May 2003