Cart (Loading....) | Create Account
Close category search window

Analysis of an LMS algorithm for unbiased impulse response estimation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
So, H.C. ; Dept. of Comput. Eng. & Inf. Technol., City Univ. of Hong Kong, China ; Chan, Y.T.

In this correspondence, a least mean squares (LMS)-based algorithm is devised for unbiased system identification in the presence of white input and output noise, assuming that the ratio of the noise powers is known. The proposed approach aims to minimize the mean square value of the equation-error function under a constant-norm constraint and is equivalent to minimizing a modified mean square error (MSE) function. An analysis of the algorithm shows that the estimates will converge to the true values in the mean sense. The variances of the parameter estimates are also available. Computer simulations are included to corroborate the theoretical development and to evaluate the impulse response estimation performance of the LMS algorithm under different conditions.

Published in:

Signal Processing, IEEE Transactions on  (Volume:51 ,  Issue: 7 )

Date of Publication:

July 2003

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.