Cart (Loading....) | Create Account
Close category search window
 

A tester-on-chip implementation in 0.18μ CMOS utilizing a MEMS interface

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Rashidzadeh, R. ; Windsor Univ., Ont., Canada ; Ahmadi, M. ; Miller, W.C.

This paper proposes a new technique for testing a core based system-on-chip (SoC). The novel feature of the approach is the use of a SoC implementation of a tester-on-chip (ToC) together with a microelectromechanical systems (MEMS) test socket instead of traditional test head. This method greatly reduces transmission line effects and supports high speed bi-directional testing. A tester-on-chip is installed in a fixed MEMS socket and connects to the die-under-test (DUT) via a removable MEMS interface. At-speed tests are carried out inside the ToC, while test results and control signals are transferred between the automatic test equipment (ATE) and ToC at low speed. Our approach eliminates the necessity of using matched impedance interfaces, costly test heads and a high-speed ATE for SoC testing and dramatically decreases the cost of SoC testing. The results in this paper are based on design and simulation studies.

Published in:

Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on  (Volume:5 )

Date of Conference:

25-28 May 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.