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Configurable two-dimensional linear feedback shifter registers for deterministic and random patterns [logic BIST]

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2 Author(s)
Chen, C.-I.H. ; Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA ; George, K.

A new deterministic built-in self-test (BIST) approach to generate a set of pre-computed test patterns followed by random test patterns is proposed. Given a set of precomputed test patterns, a simple test generator based on configurable two-dimensional (2D) linear feedback shift registers (LFSR) is synthesized to generate the given test set. This configurable 2D LFSR based test generator generates: 1) a deterministic sequence of test patterns for random-pattern-resistant faults, and then 2) random test patterns for random-pattern-detectable faults. The configurable 2D LFSR test generator can be adopted in two basic BIST execution options: test-per-clock (parallel BIST) and test-per-scan (serial BIST).

Published in:

Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on  (Volume:5 )

Date of Conference:

25-28 May 2003