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Design of programmable embedded IF source for design self-test

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3 Author(s)
Choi, S. ; Florida Univ., Gainesville, FL, USA ; Eisenstadt, W. ; Fox, R.

A programmable embedded IF source has been designed for embedded communication self-test using an on-chip memory block, a shifter register, and a noise-shaping filter. An on-chip memory element is programmed with software-generated delta-sigma modulated code. The frequency of the IF source is programmable by using a variable on-chip clock generator. The design simulation shows 45 dB single-tone SFDR with a 1200 μm × 900 μm chip area. Another improved design is in progress, which is implemented with analog FIR filtering techniques. This approach relaxes the design specifications for noise shaping filters, yielding a smaller circuit.

Published in:

Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on  (Volume:5 )

Date of Conference:

25-28 May 2003

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