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Need for undergraduate and graduate-level education in testing of microelectronic circuits and systems

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4 Author(s)
Minsu Choi ; Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA ; Pottinger, Hardy J. ; Nohpill Park ; Yong-Bin Kim

As deep-sub-micron and beyond technology emerges, quality assurance of microelectronic circuits and systems becomes more important than ever. Consequentially, (1) a strong need for well-educated microelectronic circuits and systems test engineers is desired by the industry, (2) graduate-level research efforts are also called to overcome numerous microelectronic circuits and systems test issues. This paper is to address issues related to increasing impact of the electronic circuits and systems test field on education in electrical and computer engineering and to propose suitable educational topics for undergraduate and graduate-level electrical and computer engineering courses.

Published in:

Microelectronic Systems Education, 2003. Proceedings. 2003 IEEE International Conference on

Date of Conference:

1-2 June 2003