Cart (Loading....) | Create Account
Close category search window
 

Stochastic language models for style-directed layout analysis of document images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kanungo, Tapas ; IBM Almaden Res. Center, San Jose, CA, USA ; Song Mao

Image segmentation is an important component of any document image analysis system. While many segmentation algorithms exist in the literature, very few i) allow users to specify the physical style, and ii) incorporate user-specified style information into the algorithm's objective function that is to be minimized. We describe a segmentation algorithm that models a document's physical structure as a hierarchical structure where each node describes a region of the document using a stochastic regular grammar. The exact form of the hierarchy and the stochastic language is specified by the user, while the probabilities associated with the transitions are estimated from groundtruth data. We demonstrate the segmentation algorithm on images of bilingual dictionaries.

Published in:

Image Processing, IEEE Transactions on  (Volume:12 ,  Issue: 5 )

Date of Publication:

May 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.