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Electrostatic writing and imaging using a force microscope

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2 Author(s)
Saurenbach, Frank ; IBM Almaden Res. Center, San Jose, CA, USA ; Terris, B.D.

A modified force microscope-the electrostatic force microscope (EFM)-has been used to study the charging properties of a polymer surface. A polycarbonate surface was charged by placing a small voltage on a tungsten microscope tip and touching the tip to the surface. It was found that the amount of charge transferred depended on the voltage applied to the tip and, for low voltages, was independent of previous contacts to the surface. The charge transferred was independent of the number of contacts and the contact time. These results are compared with polymer/metal contact electrification data in the literature

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Industry Applications, IEEE Transactions on  (Volume:28 ,  Issue: 1 )