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A simple method and closed-form analytic formulas for symmetric CPS based on single layer substrate (infinite and finite thickness) and multilayer lossy dielectric (semiconductor) substrate, where the permittivity of the superstrate layers decrease away from the strips, are proposed. Since the line models are given analytically, the dependencies of the line parameters may be analyzed and optimized in wide ranges of sizes, permittivities, and losses (substrate resistivity). In general, the formulas are reversible. The measured line parameters may be used to calculate the permittivity and loss tangent (resistivity) of one of the substrate layers if the parameters of the other layers and strips are known. The method may be easily extended to include larger number of substrate layers.