Cart (Loading....) | Create Account
Close category search window
 

Near-far effects in land mobile random access networks with narrow-band Rayleigh fading channels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Linnartz, J.-P.M.G. ; Telecommun. & Traffic-Control Syst. Group, Delft Univ. of Technol., Netherlands ; Hekmat, R. ; Venema, R.-J.

The near-far effect of random access protocols in mobile radio channels with receiver capture is investigated. To this end, the probability of successful reception of a packet from a terminal at a known distance from the central receiver is obtained taking into account Rayleigh fading, UHF propagation attenuation, and the statistics of contending packet traffic in radio nets employing slotted ALOHA, carrier sense multiple access (CSMA) or inhibit sense multiple access (ISMA) protocols. Various models of receiver capture are compared, namely packet error rates for synchronous detection in slow- and fast-fading channels, and the probability that the signal-to-interference ratio is above a required threshold

Published in:

Vehicular Technology, IEEE Transactions on  (Volume:41 ,  Issue: 1 )

Date of Publication:

Feb 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.