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High-voltage pulsed life for multistressed polypropylene capacitor dielectric

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1 Author(s)
J. R. Laghari ; Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA

High-voltage polypropylene capacitors were aged under singular as well as simultaneous multiple stresses (electrical, thermal, and radiation) at the University at Buffalo's 2-MW thermal nuclear reactor. These stresses were combined neutron-gamma radiation with a total dose of 1.6×106 rad, electrical stress at 40 Vrms/μm, and thermal stress at 90°C. After exposure, the polypropylene dielectric was tested for life (number of pulses to fail) under high-voltage high-repetition-rate (100 pps) pulses. Pulsed life data were also compared with AC life data. Results show that radiation stress causes the most degradation in life, either acting alone or in combination with other stresses

Published in:

IEEE Transactions on Nuclear Science  (Volume:39 ,  Issue: 1 )