Cart (Loading....) | Create Account
Close category search window
 

Blind MIMO system identification based on cumulant subspace decomposition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jing Liang ; Silicon Labs. Inc., Broomfield, CO, USA ; Zhi Ding

Blind identification of multiple-input multiple-output (MIMO) linear systems can be achieved by utilizing higher order statistics of the output signals. We study the blind identification of MIMO systems whose inputs are mutually independent, temporally white, non-Gaussian source signals. Based on sub-space analysis, we develop a new linear batch algorithm to identify MIMO systems from the common space of a set of fourth-order cumulant matrices of the channel outputs. Given knowledge of the channel orders, the identifiability conditions required by the proposed algorithm are properly established. Like most subspace-based approaches, this new algorithm remains sensitive to channel order overestimation. Simulation results illustrate its performance for various channel models.

Published in:

Signal Processing, IEEE Transactions on  (Volume:51 ,  Issue: 6 )

Date of Publication:

June 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.