By Topic

Current criticalities and innovation perspectives in flash memory design automation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Conci, A. ; MPG Flash Div., STMicroelectronics, Agrate Brianza, Italy ; Faldarini, A. ; Fumagalli, G. ; Girardi, A.
more authors

With reference to technological, architectural, and market considerations, the specific areas of design methodology and automation in flash memory design are analyzed in this paper. For each of the activities identified as critical, we show the design process key constraints and specifications, which drive the change in methodology, tools, and flows. We go through a brief survey of the solutions adopted in the recent past as well as the new emerging areas of intervention. The analysis covers: 1) design methodology, floorplanning, full-custom layout design and Rtl2Layout automation integration; 2) analog-digital mixed full-chip simulation and architectural exploration; 3) statistical analog circuital simulation; 4) mixed-signal design to test approaches; and 5) IC and package design integration.

Published in:

Proceedings of the IEEE  (Volume:91 ,  Issue: 4 )