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We apply the generalized vector sampled pattern matching (GVSPM) method to an inverse parameter problem for the reconstruction of electrical impedance tomography (EIT). Most of the inverse problems are reduced into solving for an ill-posed system of equations whose solution is not uniquely determined. The GVSPM introduced in this paper enables us to select the physically existing solution among possible ones. By applying GVSPM for EIT reconstruction, this point is verified by reliable reconstructed images.