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Characterization of diode detectors used in six-port reflectometers

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4 Author(s)
Bergeault, E. ; Telecom Paris, France ; Huyart, B. ; Geneves, G. ; Jallet, L.

A method for characterizing in situ the diodes used as power detectors in six-port network analyzers is presented. The method requires only two unknown loads which are connected at the measurement ports. Measurement results obtained for one-port and two-port devices with a dual six-port realized in the 2-18-GHz frequency range are reported. In order to show the influence of frequency, these results are compared to those obtained using a midband characterization of the diode detectors

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:40 ,  Issue: 6 )

Date of Publication:

Dec 1991

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