By Topic

An efficient method for solving electrostatic problems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shiang-Woei Chyuan ; Chung Shan Inst. of Sci. & Technol., Lung-Tan, Taiwan ; Yunn-Shiuan Liao ; Jeng-Tzong Chen

Electrostatic problems are those that deal with the effects of electric charges at rest. For modern electron and microelectromechanical systems (MEMS), an accurate electrostatic analysis is both essential and indispensable. We know that if we use the conventional boundary element method for electrostatic problems that have singularity due to degenerate boundaries, the coincidence of the boundaries gives rise to a difficult, or ill-conditioned, problem. The coincidence is when different elements use the same nodes, but there is a free-edge between the elements. The dual boundary element method (DBEM) provides fast, accurate, and efficient solutions. We compare results between finite element method (FEM) and DBEM analyses to prove DBEM's superiority. Because model creation requires the most effort in electrical engineering practices, we strongly recommend DBEM for industrial applications.

Published in:

Computing in Science & Engineering  (Volume:5 ,  Issue: 3 )