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A wide-band on-wafer noise parameter measurement system at 50-75 GHz

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4 Author(s)
Kantanen, M. ; Millimeter Wave Lab. of Finland-Millilab, VTT Tech. Res. Centre of Finland, Espoo, Finland ; Lahdes, M. ; Vaha-Heikkila, T. ; Tuovinen, J.

A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.

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Microwave Theory and Techniques, IEEE Transactions on  (Volume:51 ,  Issue: 5 )