IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Microwave Theory and Techniqu ...> Volume:51 Issue:5 Help

A wide-band on-wafer noise parameter measurement system at 50-75 GHz

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kantanen, M. ; Millimeter Wave Lab. of Finland-Millilab, VTT Tech. Res. Centre of Finland, Espoo, Finland ; Lahdes, M. ; Vaha-Heikkila, T. ; Tuovinen, J.

A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.

Published in:
Microwave Theory and Techniques, IEEE Transactions on  (Volume:51 ,  Issue: 5 )

Date of Publication: May 2003

Page(s):
1489 - 1495
ISSN :
0018-9480
INSPEC Accession Number:
7608870
Digital Object Identifier :
10.1109/TMTT.2003.810129
Product Type:
Journals & Magazines
Date of Current Version :
29 April 2003
Issue Date :
May 2003
Sponsored by :
IEEE Microwave Theory and Techniques Society

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.