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This paper introduces a novel BIST-quality metric termed the FiF-FoF (fan-in-factor and fan-out-factor) defined on PSM-states. Based on the FiF-FoF analysis, an efficient scheme is presented that ensures all state codes appear with uniform likelihood at the present state (PS) lines during the test phase. This results in higher fault efficiency in a BIST structure. Experimental results on MCNC benchmarks show that the scheme improves fault efficiency of sequential circuits significantly, with marginal area overhead.