Cart (Loading....) | Create Account
Close category search window
 

A deep submicron power estimation methodology adaptable to variations between power characterization and estimation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Eckerbert, D. ; Chalmers Univ. of Technol., Goteborg, Sweden ; Larsson-Edefors, P.

Traditionally, RTL power estimation techniques characterize a component for a fixed environment (most importantly load capacitance, activity, and operating frequency). This article presents a solution to problems originating from the ineluctably changing operating conditions such as differing load capacitance due to different applications; different activity and operating frequency. These techniques can be used in design power reduction.

Published in:

Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific

Date of Conference:

21-24 Jan. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.