By Topic

Buried-oxide silicon-on-insulator structures. II. Waveguide grating couplers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Emmons, R.M. ; Inst. of Opt., Rochester Univ., NY, USA ; Hall, Dennis G.

For pt.I, see ibid., vol.28, no.1, p.157-63 (1992). Grating couplers formed in buried-oxide silicon-on-insulator structures are analyzed using both a convergent Block wave approach and a simple approximate method. Strong interface reflections that occur during grating coupling can cause interference effects which result in variations in coupling efficiency and coupling length by an order of magnitude when varying grating period and film thickness parameters. Results indicate that proper coupler design is essential in order to obtain efficient coupling

Published in:

Quantum Electronics, IEEE Journal of  (Volume:28 ,  Issue: 1 )