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A CAD-oriented modeling approach of frequency-dependent behavior of substrate noise coupling for mixed-signal IC design

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3 Author(s)
Hai Lan ; Center for Integrated Syst., Stanford Univ., CA, USA ; Zhiping Yu ; R. W. Dutton

A simple, efficient CAD-oriented equivalent circuit modeling approach of frequency-dependent behavior of substrate noise coupling is presented. It is shown that the substrate exhibits significant frequency-dependent characteristics for high frequency applications using epitaxial layers on a highly doped substrate. Using the proposed modeling approach, circuit topographies consisting of only ideal lumped circuit elements can be synthesized to accurately represent the frequency response using y-parameters. The proposed model is well-suited for use in standard circuit simulators. The extracted model is shown to be in good agreement with rigorous 3D device simulation results.

Published in:

Quality Electronic Design, 2003. Proceedings. Fourth International Symposium on

Date of Conference:

24-26 March 2003