By Topic

Compact, low insertion-loss, sharp-rejection, and wide-band microstrip bandpass filters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lung-Hwa Hsieh ; Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA ; Kai Chang

This paper presents a new compact, low insertion-loss, sharp-rejection, and wide-band microstrip bandpass filter. A bandstop filter is introduced that uses a ring resonator with direct-connected orthogonal feed lines. A new bandpass filter based on the bandstop filter uses two tuning stubs to construct a wide-band passband with two sharp stopbands. Without coupling gaps between feed lines and rings, there are no mismatch and radiation losses between them and, therefore, the new filters show low insertion loss. In addition, a dual-mode characteristic is used to increase the stopband bandwidth of the new filters. A simple transmission-line model used to calculate the frequency responses of the filters shows good agreement with measurements. The filter using three cascaded rings has 3-dB fractional bandwidth of 49.3%, an insertion loss of better than 1.6 dB in the passband, a return loss of larger than 13 dB from 4.58 to 7.3 GHz, and two rejections of greater than 40 dB within 2.75-4.02 and 7.73-9.08 GHz. The high-performance, compact-size, and low-cost filter was designed for reducing the interference in full duplex systems in satellite communications.

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:51 ,  Issue: 4 )