Cart (Loading....) | Create Account
Close category search window
 

All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Chan, L.Y. ; Photonics Res. Center, Hong Kong Polytech. Univ., China ; Qureshi, K.K. ; Wai, P.K.A. ; Moses, B.
more authors

A novel all-optical bit-error monitoring system is demonstrated by cascading two all-optical logic gates: an inverted wavelength converter and an optical NOR gate which are realized using injection-locked laser diodes operating at different thresholds. Real-time optical monitoring signal is generated which indicates the positions and duration of both bit and burst errors in 10-Gb/s nonreturn-to-zero signals.

Published in:

Photonics Technology Letters, IEEE  (Volume:15 ,  Issue: 4 )

Date of Publication:

April 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.