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All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate

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7 Author(s)
Chan, L.Y. ; Photonics Res. Center, Hong Kong Polytech. Univ., China ; Qureshi, K.K. ; Wai, P.K.A. ; Moses, B.
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A novel all-optical bit-error monitoring system is demonstrated by cascading two all-optical logic gates: an inverted wavelength converter and an optical NOR gate which are realized using injection-locked laser diodes operating at different thresholds. Real-time optical monitoring signal is generated which indicates the positions and duration of both bit and burst errors in 10-Gb/s nonreturn-to-zero signals.

Published in:

Photonics Technology Letters, IEEE  (Volume:15 ,  Issue: 4 )

Date of Publication:

April 2003

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