Referenced Items are not available for this document.
The thermal degradation of ITO Schottky contacts on GaAs has been studied. The rectifying contacts show rapid degradation with heating and could have serious implications for optoelectronic devices that operate at elevated temperatures.
Published in:
Electronics Letters
(Volume:28
,
Issue:
2
)
Date of Publication: 16 Jan. 1992
- Page(s):
- 142 - 144
- ISSN :
- 0013-5194
- INSPEC Accession Number:
- 4098578
- Digital Object Identifier :
- 10.1049/el:19920088
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- 16 Jan. 1992
- Sponsored by :
- Institution of Engineering and Technology
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