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Electromagnetic signatures as a tool for connectionless test

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2 Author(s)
M. Salamati ; Electron. Production Eng. Res. Group, Orebro Univ., Sweden ; D. Stranneby

When we test boards, we usually think in terms of traditional electrical test (in-circuit, flying probe) and nonelectrical test (optical, x-ray). This Orebro University article develops an alternative, connectionless technique based on scanning the electromagnetic field generated by active on-board devices. Could this make it into industry as an additional diagnostic tool?.

Published in:

IEEE Design & Test of Computers  (Volume:20 ,  Issue: 2 )