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Embedded boundary scan

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2 Author(s)
Van Treuren, B.G. ; Test Solutions Group, Lucent Technol., Holmdel, NJ, USA ; Miranda, J.M.

As boundary scan technology continues to mature, engineers continue to find innovative ways of using the IEEE Std. 1149.1 facilities throughout the life cycle of a board. Lucent Technologies is at the forefront of this development, and the authors here describe how they have expanded the use and reuse of the IEEE 1149.1 board tests into a variety of additional test environments.

Published in:

Design & Test of Computers, IEEE  (Volume:20 ,  Issue: 2 )